Introduction

Universeller ICT/BS/FCT I/O-Modul-Tester

The ICT/BS/FCT version of the UTP 9010 platform comprises versatile test systems which have been designed to achieve considerable manufacturing quality intensification due to early error detection. It is able to conduct a wide range of Functional, In Circuit and Boundary scan tests.

ICT/BS/FCT systems include automated DUT detection and offer flexible adaptability to new product variants.

Because of its exchangeable adapter system the tester platform is able to test different products showing various connectors and hardware specifications one after the other. Extended tooling times will not occur between test cycles.

The system is not only capable of thoroughly testing analogue and digital I/O modules and counters; it is also well-prepared for testing module-integrated LEDs. Suitable LED test sequences can be added whenever they are required.

In case of a significant increase in production the modular and flexible test system can be upgraded for fully automated production lines. This can be achieved by upgrading to higher UTP standards for automated inline tests (UTP 9065, UTP 9070, etc.) or by making use of rotary indexing table systems such as the UTP 9085.

Advantages

  • All features of the standard UTP 9010 platform can be used without restrictions
  • Constant expandability for new products
  • Time-saving variant changes due to exchangeable adaptor system
  • Bar code reading via hand-held scanner
  • Database-driven IDM/ODM data management system

Conclusion

The NOFFZ UTP 9010 ICT/BS/FCT tester for versatile applications shows flexible adaptability to new product variants at any time and provides an automated DUT detection module. It can be upgraded for testing further modules, so that analog modules are not longer only subject to current measurements (4… 20 mA) but also undergo voltage measurements (+/- 10V).

The system is not only able to test analogue and digital I/O modules and counters; it is also well-prepared for testing module-integrated LEDs. Respective test sequences can flexibly be added whenever they are required.