Universal Wireless Tester
TEST MULTIPLE RF CHANNELS AND STANDARDS IN PARALLEL
Universal Wireless Tester
Unique non-signaling RF test platform for validation and production
Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
These developments require complex and parallel test solutions with high channel counts to meet throughput and yield targets.
NOFFZ and NI have jointly developed the Universal Wireless Tester (UWT) to address these test challenges. The UWT provides a suitable solution to meet the high RF channel count requirements while remaining very flexible and cost-effective.
Designed to be the most flexible platform for RF testing of modern wireless standards
The Universal Wireless Tester provides non-signaling verification of modern wireless and connectivity standards, e.g. C-V2X, 5G, 802.11 ax, BLE, and UWB.
The UWT reduces the testing duration through parallel testing of multiple DUTs, automatic RF port routing, and automatic resource utilization. For higher throughput, the system can be easily upgraded to up to four transceivers with an additional analyzer and generator. At the same time, downtime for maintenance or calibration is minimized through automatic reassignment between test adapters and transceivers.
This unique technology leads to a reduction in overall test costs by reducing test times. It also enables future-proof system scalability for 6 GHz Wi-Fi, 10 GHz UWB, or 5G NR in the millimeter wave range.
THIS IS WHAT DISTINGUISHES OUR PRODUCT
Features & Specifications
- Open, scalable, software-centric system based on NI PXI for testing 5G NR, LTE, WCDMA, GSM, V2X, 802.11 a/b/g/n/ac/ax/p, BT, BLE, UWB
- Universal RF switch (NOFFZ UMX) with 32 bidirectional DUT ports and integrated signal conditioning
- Scalable to 128 RF channels by using up to four NI vector signal transceivers and four UMXs
- Additional waveform generation capacities for GNSS and broadcast expand technology coverage for test applications, including product validation
- Instrument software for automated assignment of test channels to instrument resources via the NOFFZ UMX for minimum downtime
- RF test suite for DUT control, test sequencing, hardware abstraction, and automatic switching functions
Number of transceivers can be flexibly adjusted to meet project requirements
Advantages
Long-term support
- Test coverage of past, current, and future wireless standards. From sub-6 GHz to millimeter wave frequencies
High number of RF channels
- Optional connections to DUTs with more than eight antennas or batch testing
Cooperative transceiver mode
- Unique architecture for automated reuse, reallocation, and expansion of resources for maximum flexibility
Cost efficiency
- Combination of fast testing times, high instrument utilization, and competitive ‘cost per RF channel’ to achieve the best possible total test cost
THE KEY TO SUCCESS
The universal RF switch matrix: NOFFZ UMX
Serial setup of test system UTP 9010
as End-of-Line variant
Detail view of RF chamber UTP 5070
für geschirmte Messungen
The concept is made possible by the Universal Switch Matrix (UMX), an 8×32 RF switch matrix with integrated DC load emulation and voltage/current measurement block. It ensures the collective use of measurement devices and the planning of individual measurement tasks. The switch matrix connects the active antennas at all times. It can also apply loads or simulate faults. It is specifically designed for high numbers of antennas and large quantities. Furthermore, the UMX offers future expansion options and covers modern technologies such as C-V2X, 5G, 802.11ax, BLE, and UWB.
NOFFZ Universal Switch Matrix
with integrated DC frontend
NOFFZ UMX Control Software
for interactive operation
IN AKTION
Getting started with the Universal Wireless Tester
Practical implementation of typical RF test cases
The UWT is designed for non-signaling tests in validation and production. The video series demonstrates the unique selling points: 1. Parallel testing of multiple DUTs, 2. Parallel testing of different wireless standards, 3. Adding more transceivers.
IN AKTION
Getting started with the Universal Wireless Tester
Practical implementation of typical RF test cases
The UWT is designed for non-signaling tests in validation and production. The video series demonstrates the unique selling points: 1. Parallel testing of multiple DUTs, 2. Parallel testing of different wireless standards, 3. Adding more transceivers.
FOR YOUR SMART PRODUCTION
Automated UTP 6010 for Telematic Control Unit
Robot-controlled loading and unloading of the NOFFZ HF chamber
In this video, the control of the integrated HF chamber is automated with the help of a collaborating robot arm. It handles the opening and closing of the drawer as well as the insertion and removal of the Telematic Control Unit.
DO YOU HAVE ANY QUESTIONS?
Speak with our experts directly!
Let us know the details of your project. We’re curious about your ideas, products, and requirements and would be glad to advise you specifically about your requests.
Together we’ll make your project a success!
Let’s set up a meeting.
Ales Zitek
Sales Manager Eastern Europe NOFFZ Technologies Hungary Kft.
Automotive devices must be reliable.
Combine all products and
measuring instruments in just one rack for validation.
Test devices with high channel counts in parallel.
An entire mobile network at the work table.
Emulate the cellular mobile environment that you need.
Test your wireless devices more easily than ever before.
Parallel from 2G to 5G and extensively endurance tested.
Modify satellite trajectories. Simulate environments.
Generate a variety of realistic multiband GNSS signals. Define your parameters individually and test them with high precision. Directly in the lab and in real time.
Larger displays and increasing connectivity.
Improved technologies are setting a rapid pace.
These innovations require intelligent test systems.
We create your individual solution with high precision.
